HOME > 論文 > 書誌詳細Bayesian inference for peak feature extraction and prediction of material property in X-ray diffraction dataRyo Murakami, Taisuke T. Sasaki, Hideki Yoshikawa, Yoshitaka Matsushita, Keitaro Sodeyama, Tadakatsu Ohkubo, Hiroshi Shinotsuka, Kenji Nagata. Science and Technology of Advanced Materials: Methods 4 [1] 2384352. 2024.https://doi.org/10.1080/27660400.2024.2384352 Open Access Informa UK Limited (Publisher) Materials Data Repository (MDR) NIMS著者佐々木 泰祐吉川 英樹松下 能孝袖山 慶太郎大久保 忠勝篠塚 寛志永田 賢二Materials Data Repository (MDR)上の本文・データセットMDRavailable Bayesian inference for peak feature extraction and prediction of material property in X-ray diffraction data 作成時刻: 2025-07-16 03:07:31 +0900 更新時刻: 2026-08-30 06:19:55 +0900
