HOME > 論文 > 書誌詳細Oxygen Defects and Instability in Very Thin a‐IGZO TFTsHanjun Cho, Masatake Tsuji, Shigenori Ueda, Junghwan Kim, Hideo Hosono. Advanced Electronic Materials 11 [15] e00349. 2025.https://doi.org/10.1002/aelm.202500349 Open Access Wiley (Publisher) Materials Data Repository (MDR) NIMS著者上田 茂典細野 秀雄Materials Data Repository (MDR)上の本文・データセットMDRavailable Oxygen Defects and Instability in Very Thin a‐IGZO TFTs 作成時刻: 2025-09-25 03:11:41 +0900 更新時刻: 2026-10-08 09:12:54 +0900
