HOME > Article > DetailOxygen Defects and Instability in Very Thin a‐IGZO TFTsHanjun Cho, Masatake Tsuji, Shigenori Ueda, Junghwan Kim, Hideo Hosono. Advanced Electronic Materials 11 [15] e00349. 2025.https://doi.org/10.1002/aelm.202500349 Open Access Wiley (Publisher) Materials Data Repository (MDR) NIMS author(s)UEDA, ShigenoriHOSONO, HideoFulltext and dataset(s) on Materials Data Repository (MDR)MDRavailable Oxygen Defects and Instability in Very Thin a‐IGZO TFTs Created at: 2025-09-25 03:11:41 +0900 Updated at: 2026-10-08 09:12:54 +0900
