Band-Gap Deformation Potential and Elasticity Limit of Semiconductor Free-Standing Nanorods Characterized in Situ by Scanning Electron Microscope–Cathodoluminescence Nanospectroscopy | 研究者総覧SAMURAI - 物質・材料研究機構 (NIMS)

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Band-Gap Deformation Potential and Elasticity Limit of Semiconductor Free-Standing Nanorods Characterized in Situ by Scanning Electron Microscope–Cathodoluminescence Nanospectroscopy
(SEM-CL顕微分光法を用いた半導体自立ナノロッドのバンドギャップ変形ポテンシャル・弾性限界のその場評価)

Kentaro Watanabe, Takahiro Nagata, Yutaka Wakayama, Takashi Sekiguchi, Róbert Erdélyi, János Volk.

ACS Nano 9 [3] 2989-3001. 2015.

https://doi.org/10.1021/nn507159u

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作成時刻: 2016-05-24 17:46:29 +0900更新時刻: 2024-03-31 18:45:53 +0900

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