Band-Gap Deformation Potential and Elasticity Limit of Semiconductor Free-Standing Nanorods Characterized in Situ by Scanning Electron Microscope–Cathodoluminescence Nanospectroscopy
(SEM-CL顕微分光法を用いた半導体自立ナノロッドのバンドギャップ変形ポテンシャル・弾性限界のその場評価)
NIMS author(s)
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Created at: 2016-05-24 17:46:29 +0900Updated at: 2024-03-31 18:45:53 +0900