Direct Analysis of Stacked Au/Ti/In<sub>2</sub>O<sub>3</sub>/Al<sub>2</sub>O<sub>3</sub>/p<sup>+</sup>-Si Transport Mechanisms Using Operando Hard X-ray Photoelectron Spectroscopy | 研究者総覧SAMURAI - 物質・材料研究機構 (NIMS)

HOME > 論文 > 書誌詳細

Direct Analysis of Stacked Au/Ti/In₂O₃/Al₂O₃/p⁺-Si Transport Mechanisms Using Operando Hard X-ray Photoelectron Spectroscopy

Ibrahima Gueye, Shigenori Ueda, Atsushi Ogura, Takahiro Nagata.

ACS Applied Electronic Materials 6 [5] 3237-3248. 2024.

https://doi.org/10.1021/acsaelm.4c00049

NIMS著者

Materials Data Repository (MDR)上の本文・データセット

作成時刻: 2024-10-12 03:13:45 +0900更新時刻: 2024-11-14 08:49:23 +0900

▲ページトップへ移動