Direct Analysis of Stacked Au/Ti/In<sub>2</sub>O<sub>3</sub>/Al<sub>2</sub>O<sub>3</sub>/p<sup>+</sup>-Si Transport Mechanisms Using Operando Hard X-ray Photoelectron Spectroscopy | 研究者総覧SAMURAI - 物質・材料研究機構 (NIMS)

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Direct Analysis of Stacked Au/Ti/In₂O₃/Al₂O₃/p⁺-Si Transport Mechanisms Using Operando Hard X-ray Photoelectron Spectroscopy

Ibrahima Gueye, Shigenori Ueda, Atsushi Ogura, Takahiro Nagata.

ACS Applied Electronic Materials 6 [5] 3237-3248. 2024.

https://doi.org/10.1021/acsaelm.4c00049

Open Access American Chemical Society (ACS) (Publisher) Materials Data Repository (MDR)

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Materials Data Repository (MDR)上の本文・データセット

MDRavailable Direct Analysis of Stacked Au/Ti/In<sub>2</sub>O<sub>3</sub>/Al<sub>2</sub>O<sub>3</sub>/p<sup>+</sup>-Si Transport Mechanisms Using Operando Hard X-ray Photoelectron Spectroscopy

作成時刻: 2024-10-12 03:13:45 +0900 更新時刻: 2025-06-22 07:23:32 +0900

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