Direct Analysis of Stacked Au/Ti/In<sub>2</sub>O<sub>3</sub>/Al<sub>2</sub>O<sub>3</sub>/p<sup>+</sup>-Si Transport Mechanisms Using Operando Hard X-ray Photoelectron Spectroscopy | SAMURAI, NIMS Researchers Directory Service

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Direct Analysis of Stacked Au/Ti/In₂O₃/Al₂O₃/p⁺-Si Transport Mechanisms Using Operando Hard X-ray Photoelectron Spectroscopy

Ibrahima Gueye, Shigenori Ueda, Atsushi Ogura, Takahiro Nagata.

ACS Applied Electronic Materials 6 [5] 3237-3248. 2024.

https://doi.org/10.1021/acsaelm.4c00049

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Created at: 2024-10-12 03:13:45 +0900Updated at: 2024-12-15 09:14:21 +0900

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