HOME > 論文 > 書誌詳細Comparison of device structures for the dielectric breakdown measurement of hexagonal boron nitrideYoshiaki Hattori, Takashi Taniguchi, Kenji Watanabe, Kosuke Nagashio. Applied Physics Letters 109 [25] 253111. 2016.https://doi.org/10.1063/1.4972555 NIMS著者谷口 尚渡邊 賢司Materials Data Repository (MDR)上の本文・データセット作成時刻: 2017-02-19 23:32:09 +0900更新時刻: 2024-04-01 22:35:31 +0900
