HOME > Article > DetailComparison of device structures for the dielectric breakdown measurement of hexagonal boron nitrideYoshiaki Hattori, Takashi Taniguchi, Kenji Watanabe, Kosuke Nagashio. Applied Physics Letters 109 [25] 253111. 2016.https://doi.org/10.1063/1.4972555 NIMS author(s)TANIGUCHI, TakashiWATANABE, KenjiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-02-19 23:32:09 +0900Updated at: 2024-05-02 09:18:40 +0900
