HOME > 論文 > 書誌詳細Investigation of ramped voltage stress to screen defective magnetic tunnel junctionsChulmin Choi, Hiroaki Sukegawa, Seiji Mitani, Yunheub Song. Semiconductor Science and Technology 33 [1] 015006. 2018.https://doi.org/10.1088/1361-6641/aa99bb NIMS著者介川 裕章三谷 誠司Materials Data Repository (MDR)上の本文・データセット作成時刻: 2017-12-07 20:47:20 +0900更新時刻: 2024-10-08 06:02:35 +0900
