HOME > Article > DetailInvestigation of ramped voltage stress to screen defective magnetic tunnel junctionsChulmin Choi, Hiroaki Sukegawa, Seiji Mitani, Yunheub Song. Semiconductor Science and Technology 33 [1] 015006. 2018.https://doi.org/10.1088/1361-6641/aa99bb NIMS author(s)SUKEGAWA, HiroakiMITANI, SeijiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-12-07 20:47:20 +0900Updated at: 2024-05-02 07:55:12 +0900
