HOME > 論文 > 書誌詳細Focused Ion Beam Imaging of Defects in Multicrystalline Si for Photovoltaic ApplicationY. Miyamura, T. Sekiguchi, J. Chen, J.Y. Li, K. Watanabe, K. Kumagai, A. Ogura. Acta Physica Polonica A 125 [4] 991-993. 2014.https://doi.org/10.12693/aphyspola.125.991 Open Access Institute of Physics, Polish Academy of Sciences (Publisher) NIMS著者陳 君Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-05-24 17:45:12 +0900更新時刻: 2024-03-30 01:15:02 +0900
