HOME > Article > DetailFocused Ion Beam Imaging of Defects in Multicrystalline Si for Photovoltaic ApplicationY. Miyamura, T. Sekiguchi, J. Chen, J.Y. Li, K. Watanabe, K. Kumagai, A. Ogura. Acta Physica Polonica A 125 [4] 991-993. 2014.https://doi.org/10.12693/aphyspola.125.991 Open Access Institute of Physics, Polish Academy of Sciences (Publisher) NIMS author(s)CHEN, JunFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2016-05-24 17:45:12 +0900 Updated at: 2026-10-30 04:14:44 +0900
