HOME > 論文 > 書誌詳細Unraveling the Resistive Switching Mechanisms in LaMnO3+δ-Based Memristive Devices by Operando Hard X-ray Photoemission MeasurementsBenjamin Meunier, Eugénie Martinez, Raquel Rodriguez-Lamas, Dolors Pla, Monica Burriel, Carmen Jimenez, Yoshiyuki Yamashita, Olivier Renault. ACS Applied Electronic Materials 3 [12] 5555-5562. 2021.https://doi.org/10.1021/acsaelm.1c00968 NIMS著者山下 良之Materials Data Repository (MDR)上の本文・データセット作成時刻: 2022-01-05 03:24:53 +0900更新時刻: 2024-03-31 14:17:46 +0900