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Unraveling the Resistive Switching Mechanisms in LaMnO3+δ-Based Memristive Devices by Operando Hard X-ray Photoemission Measurements

Benjamin Meunier, Eugénie Martinez, Raquel Rodriguez-Lamas, Dolors Pla, Monica Burriel, Carmen Jimenez, Yoshiyuki Yamashita, Olivier Renault.
ACS Applied Electronic Materials 3 [12] 5555-5562. 2021.

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    Created at: 2022-01-05 03:24:53 +0900Updated at: 2024-03-31 14:17:46 +0900

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