SAMURAI - NIMS Researchers Database

NIMS Award Symposium 2026

HOME > Article > Detail

Unraveling the Resistive Switching Mechanisms in LaMnO3+δ-Based Memristive Devices by Operando Hard X-ray Photoemission Measurements

Benjamin Meunier, Eugénie Martinez, Raquel Rodriguez-Lamas, Dolors Pla, Monica Burriel, Carmen Jimenez, Yoshiyuki Yamashita, Olivier Renault.
ACS Applied Electronic Materials 3 [12] 5555-5562. 2021.

NIMS author(s)


Fulltext and dataset(s) on Materials Data Repository (MDR)


    Created at: 2022-01-05 03:24:53 +0900 Updated at: 2026-09-29 07:14:02 +0900

    ▲ Go to the top of this page