HOME > Article > DetailDielectric Breakdown in Single-Crystal Hexagonal Boron NitrideAlok Ranjan, Nagarajan Raghavan, Matthew Holwill, Kenji Watanabe, Takashi Taniguchi, Kostya S. Novoselov, Kin Leong Pey, Sean J. O’Shea. ACS Applied Electronic Materials 3 [8] 3547-3554. 2021.https://doi.org/10.1021/acsaelm.1c00469 NIMS author(s)WATANABE, KenjiTANIGUCHI, TakashiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2023-10-22 03:13:39 +0900 Updated at: 2026-10-08 08:51:37 +0900
