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HOME > Profile > CRETU, Ovidiu


PublicationsNIMS affiliated publications since 2004.


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Center for Basic Research on Materials

Novel microscopy techniques for advanced characterization


Electric field mapping, Nanoscale temperature distribution, Thermal vibration mode imaging


Our aim is to extend the range of information that can be obtained by transmission electron microscopy (TEM) by developing new analysis methods. By combining these new techniques with the already impressive capabilities of modern TEMs, we can measure material properties which are not accessible by any other methods. This furthers our understanding of the advanced materials investigated and provides feedback towards improving their performance.

Novelty and originality

Atomic-resolution measurement of the distribution of electric fields around defects in 2-D materials
Direct observation of the thermal vibration modes of individual nanowires
Nanometer-scale temperature mapping of in-situ Joule-heated carbon nanotubes



(a) By introducing new hardware and custom-developed software, we were able to build a multi-dimension data acquisition system which allows characterizing the electrostatic properties of materials. (b) With the addition of a high-speed data acquisition interface, we were able to acquire signals in the MHz range and thus measure the vibration properties of nanomaterials and directly observe their vibration modes. (c) By carefully measuring changes in the plasmon energy, we could determine the temperature distribution of individual carbon nanotubes, while heating them to the limit of their stability at over 2000K


The current research offers new critical information:
About the properties of defects in 2D materials, which influence their electrical performance and damage mechanism.
About the vibration properties of nanowires, towards their use as resonators or electron sources.
About the thermal strength of carbon nanotubes under electrical load, as ultimate interconnects.


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