HOME > Proceedings > DetailDevelopment of a double-tilt stage-scanning sample holder for scanning confocal electron microscopy of single crystal samplesTAKEGUCHI, Masaki, HASHIMOTO, Ayako, MITSUISHI, Kazutaka, Xiaobin Zhang, M. Shimojo, T.Ishikawa, S. Deguchi, T. Naruse, Y. Kondo. AMTC Letters 110-111. 2010.NIMS author(s)TAKEGUCHI, MasakiHASHIMOTO, AyakoMITSUISHI, KazutakaFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-02-27 01:52:19 +0900 Updated at: 2017-03-17 03:57:11 +0900