HOME > 会議録 > 書誌詳細Significance of Frequency Analysis in X-Ray Reflectivity: Towards analysis which does not depend too much on models(X線・中性子反射率法: 最近の進歩と将来展望)SAKURAI, Kenji, MIZUSAWA, Tazuko, ISHII, Masashi. TRANSACTIONS OF THE MATERIALS RESEARCH SOCIETY OF JAPAN 523-528. 2008.NIMS著者石井 真史Materials Data Repository (MDR)上の本文・データセット作成時刻 :2017-02-27 01:24:58 +0900 更新時刻 :2017-09-06 21:27:39 +0900