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Comparison of Grain Boundaries in Multicrystalline Si Ingot and Artificial Grain Boundaries in Bonded Si Wafers

謝栄国, SEKIGUCHI, Takashi, CHEN, Jun, 楊徳仁, 伊藤俊.
Proc. of the 4th International Symposium on Advanced Science and Technology of Silicon Materials 424-428. 2004.

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