HOME > 会議録 > 書誌詳細Comparison of Grain Boundaries in Multicrystalline Si Ingot and Artificial Grain Boundaries in Bonded Si Wafers謝栄国, SEKIGUCHI, Takashi, CHEN, Jun, 楊徳仁, 伊藤俊. Proc. of the 4th International Symposium on Advanced Science and Technology of Silicon Materials 424-428. 2004.NIMS著者陳 君Materials Data Repository (MDR)上の本文・データセット作成時刻: 2017-02-27 00:41:58 +0900更新時刻: 2017-03-17 02:43:03 +0900
