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TEM characterization on the interfaces of the (111) diamond metal insulator semiconductor field effect transistor (MISFET) gate

LIU, ZHIQUAN, MITSUISHI, Kazutaka, FURUYA, Kazuo, Hirama Kazuyuki, Umezawa Hitoshi, Satoh Mitsuya, Kawarada Hiroshi, Saito Takeyasu, Okushi Hideyo, Park Kyung-ho.

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Materials Data Repository (MDR)上の本文・データセット


    作成時刻 :2017-02-27 01:02:54 +0900 更新時刻 :2017-03-17 03:02:58 +0900

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