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TEM characterization on the interfaces of the (111) diamond metal insulator semiconductor field effect transistor (MISFET) gate

LIU, ZHIQUAN, MITSUISHI, Kazutaka, FURUYA, Kazuo, Hirama Kazuyuki, Umezawa Hitoshi, Satoh Mitsuya, Kawarada Hiroshi, Saito Takeyasu, Okushi Hideyo, Park Kyung-ho.
Proceedings of the 16th International Microscopy Congress 1487-1487. 2006.

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