HOME > Proceedings > DetailNovel electron microscopy method for accurate measurements of the lattice constant changes in layered structuresMITSUISHI, Kazutaka, BEKAREVICH, Raman, TAKEGUCHI, Masaki, OHNISHI, Tsuyoshi, UESUGI, Fumihiko. Journal of Surface Analysis 190-191. 2019.NIMS author(s)MITSUISHI, KazutakaTAKEGUCHI, MasakiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2020-01-15 03:00:21 +0900 Updated at: 2020-01-15 03:00:21 +0900