HOME > 会議録 > 書誌詳細Novel electron microscopy method for accurate measurements of the lattice constant changes in layered structuresMITSUISHI, Kazutaka, BEKAREVICH, Raman, TAKEGUCHI, Masaki, OHNISHI, Tsuyoshi, UESUGI, Fumihiko. Journal of Surface Analysis 190-191. 2019.NIMS著者三石 和貴竹口 雅樹大西 剛上杉 文彦Materials Data Repository (MDR)上の本文・データセット作成時刻: 2020-01-15 03:00:21 +0900更新時刻: 2020-01-15 03:00:21 +0900
