HOME > Proceedings > Detail
Novel electron microscopy method for accurate measurements of the lattice constant changes in layered structures
| Author(s) | MITSUISHI, Kazutaka, BEKAREVICH, Raman, TAKEGUCHI, Masaki, OHNISHI, Tsuyoshi, UESUGI, Fumihiko. |
|---|---|
| Proceedings title | Journal of Surface Analysis |
| Year of publication | 2019 |
| Language | English |