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Novel electron microscopy method for accurate measurements of the lattice constant changes in layered structures

MITSUISHI, Kazutaka, BEKAREVICH, Raman, TAKEGUCHI, Masaki, OHNISHI, Tsuyoshi, UESUGI, Fumihiko.

Journal of Surface Analysis 190-191. 2019.

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Fulltext and dataset(s) on Materials Data Repository (MDR)

Created at: 2020-01-15 03:00:21 +0900Updated at: 2020-01-15 03:00:21 +0900

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