Recent Novel X-ray Reflectivity Techniques:Moving Towards Quicker Measurement to Observe Changes at Surface and Buried Interfaces | SAMURAI, NIMS Researchers Directory Service

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Recent Novel X-ray Reflectivity Techniques:Moving Towards Quicker Measurement to Observe Changes at Surface and Buried Interfaces
(新しいＸ線反射率法：埋もれた界面の変化を見ることのできるもっと迅速な測定を目指して)

SAKURAI, Kenji, MIZUSAWA, Tazuko, ISHII, Masashi.

TRANSACTIONS OF THE MATERIALS RESEARCH SOCIETY OF JAPAN 181-186. 2007.

NIMS author(s)

ISHII, Masashi

Fulltext and dataset(s) on Materials Data Repository (MDR)

Created at: 2017-02-27 01:12:32 +0900 Updated at: 2017-03-17 03:11:59 +0900

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