Simultaneous Estimation of Interfacial and Bulk Thermal Resistances in Thermal Interface Materials with Si Substrates under Controlled Uniaxial Pressure Using Lock-in Thermography | 研究者総覧SAMURAI - 物質・材料研究機構 (NIMS)

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Simultaneous Estimation of Interfacial and Bulk Thermal Resistances in Thermal Interface Materials with Si Substrates under Controlled Uniaxial Pressure Using Lock-in Thermography

Kota Hasegawa, Takamasa Hirai, Fuyuki Ando, Ryo Takahashi, Naoki Takahara, Ken-Ichi Uchida.

2026 42nd Semiconductor Thermal Measurement, Modeling &amp; Management Symposium (SEMI-THERM) 131-137. 2026.

https://doi.org/10.23919/semi-therm71268.2026.11573126

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Materials Data Repository (MDR)上の本文・データセット

作成時刻: 2026-09-10 03:05:52 +0900 更新時刻: 2026-09-11 03:06:33 +0900

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