HOME > 会議録 > 書誌詳細STUDY OF CRYSTALLINE DEFECT GENERATION CAUSED BY LIGHT ELEMENT IMPURITIES IN SILICON SUBSTRATETachibana Tomihisa, Sameshima Takashi, Kojima Takuto, Arafune Koji, Kakimoto Koichi, MIYAMURA, Yoshiji, HARADA, Hirofumi, SEKIGUCHI, Takashi, Ohshita Yoshio, Ogura Atshushi. Technical digest of PVSEC-21 2D-1P-15-2D-1P-15. 2011.NIMS著者Materials Data Repository (MDR)上の本文・データセット作成時刻: 2017-02-27 02:08:01 +0900更新時刻: 2017-03-17 04:15:52 +0900
