HOME > 会議録 > 書誌詳細EBIC Analysis of Breakdown Failure Point in 4H-SiC PiN DiodesOhyanagi Takasumi, CHEN, Bin, SEKIGUCHI, Takashi, Yamaguchi Hirotaka, Hirofumi Matsuhata. MATERIALS SCIENCE FORUM 707-710. 2009.NIMS著者Materials Data Repository (MDR)上の本文・データセット作成時刻: 2017-02-27 01:38:17 +0900更新時刻: 2017-03-17 03:41:00 +0900
