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EBIC Analysis of Breakdown Failure Point in 4H-SiC PiN Diodes

Ohyanagi Takasumi, CHEN, Bin, SEKIGUCHI, Takashi, Yamaguchi Hirotaka, Hirofumi Matsuhata.
MATERIALS SCIENCE FORUM 707-710. 2009.

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      Created at: 2017-02-27 01:38:17 +0900Updated at: 2017-03-17 03:41:00 +0900

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