SAMURAI - NIMS Researchers Database

HOME > Proceedings > Detail

Visibility of misfit dislocations at the interface of strained Si/Si0.8Ge0.2 by EBIC

Yuan, Xiaoli, CHEN, Jun, Ri Sungi , Ito Shun, SEKIGUCHI, Takashi.

NIMS author(s)


Fulltext and dataset(s) on Materials Data Repository (MDR)


    Created at: 2017-02-14 11:25:29 +0900Updated at: 2017-03-17 04:32:29 +0900

    ▲ Go to the top of this page