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Si(100)基板上のGeドットの静電気力プローブ顕微鏡観測
(Observation of Ge dots on Si(100) substrate with electrostatic scanning probe microscopy)
2009年春季 第56回応用物理学関係連合講演会. March 30, 2009-April 02, 2009.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-01-08 04:46:20 +0900 Updated at: 2017-07-10 20:28:38 +0900