HOME > Presentation > Detail負けCuイオン照射中に発生する発光強度の線量依存性(Relation of emitted light intensity with current density in negative Cu ion implantation)Thi Thi Lay, 雨倉 宏, 梅田直樹, 武田 良彦, 岸本 直樹, Thi Thi Lay, 梅田直樹. 1999秋季第60回応用物理学会学術講演会. September 01, 1999-September 04, 1999.NIMS author(s)AMEKURA, HiroshiTAKEDA, YoshihikoFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-02-18 01:45:52 +0900 Updated at: 2017-07-10 17:57:54 +0900