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Development of UHV Scanning Probe Microscope with External Stress and Strain Application
IVC-17/ICSS-13 and ICN+T2007 Congress. July 01, 2007-July 06, 2007.
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Created at: 2017-01-08 04:06:50 +0900 Updated at: 2017-07-10 19:56:00 +0900