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低速陽電子ビームによるイオン注入Siの水素‐空孔複合体の検出
(Hydrogen-terminated defects in ion-implanted Silicon probed by monoenergetic positron beams)
2002秋季第63回応用物理学会学術講演会. September 24, 2002-September 27, 2002.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-02-18 02:42:35 +0900 Updated at: 2017-07-10 18:27:32 +0900