HOME > Presentation > Detail(Delamination study on REBCO conductors due to screening current)マ ドンシャ, 張 治宇, 松本 真治, Ryo Teranishi, 大村 孝仁, 木吉 司. ISS 2013. November 18, 2013-November 20, 2013.NIMS author(s)MATSUMOTO, ShinjiOHMURA, TakahitoFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-02-14 11:15:17 +0900Updated at: 2017-07-10 21:44:26 +0900