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Evaluation of Proton-induced Deep Levels in Si
(陽子線照射によるn-si中の深い準位の評価)
Materials Research Society 1996 Fall Meeting. December 02, 1996-December 06, 1996.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-02-18 01:11:07 +0900 Updated at: 2017-07-10 17:39:38 +0900