HOME > Presentation > DetailAl-Cu接合試料のSEM像コントラストと二次電子スペクトルの関係について(Secondary electron image contrast of Al-Cu inter-metallic compound and relations of the secondary electron spectrum)荻原 俊弥, 吉川 英樹. 2015年度実用表面分析講演会. November 16, 2015-November 17, 2015.NIMS author(s)OGIWARA, ToshiyaYOSHIKAWA, HidekiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-02-14 11:39:06 +0900 Updated at: 2018-06-05 13:51:52 +0900