HOME > Presentation > Detailシリコン中の水素の深さ濃度分布と局所振動モードの関係(Relationship between depth profiles and localized vibrational modes of hydrogen in silicon)福田真也, 森俊樹, 森澤邦友, 石岡 邦江, 北島 正弘, 坂口 勲, 菱田 俊一, 村上浩一. 2002秋季第63回応用物理学会学術講演会. September 24, 2002-September 27, 2002.NIMS author(s)ISHIOKA, KunieSAKAGUCHI, IsaoFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-02-18 02:43:38 +0900 Updated at: 2018-05-30 18:54:12 +0900