HOME > Presentation > Detail
電子線励起超軟X線分光分析装置による超軟X線スペクトルの観察
(Development of Ultra-Soft X-ray Spectrometer for Electron Probe Microanalysis)
第28回表面分析研究会. June 19, 2006-June 20, 2006. Invited
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-01-08 03:30:07 +0900 Updated at: 2024-03-05 11:41:08 +0900