SAMURAI - NIMS Researchers Database

HOME > Presentation > Detail


(Electrostatically-Reversible Polarity of Dual-Gated Graphene Transistors with He Ion Irradiated Channel: Toward Reconfigurable CMOS Applications)

中払 周, Tomohiko Iijima, Shinich Ogawa, Shingo Suzuki, 塚越 一仁, Shintaro Sato, Naoki Yokoyama.
IEEE International Electron Devices Meeting (IEDM). 2012.

NIMS author(s)


Fulltext and dataset(s) on Materials Data Repository (MDR)


    Created at: 2017-02-14 11:09:18 +0900Updated at: 2017-07-10 21:30:53 +0900

    ▲ Go to the top of this page