HOME > Presentation > Detail
バッファーレイヤーの欠陥構造と酸化物薄膜の結晶性との相関
(Relationship between crystalinity and buffer layer defect structure in thin films)
2001年電気化学秋季大会. 2001. Invited
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-02-14 11:34:38 +0900Updated at: 2024-03-05 11:39:23 +0900