HOME > Presentation > Detail(Transmission Electron Microscopy Observation of MgB2/Ni and MgB2/B Multilayered Superconducting Thin Films )H. Sosiati, S. Hata, T.Doi, 松本 明善, 北口 仁. International Symposium on Role of Electron Microscopy in Indust. 2012.NIMS author(s)MATSUMOTO, AkiyoshiKITAGUCHI, HitoshiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-01-08 04:09:44 +0900Updated at: 2017-07-10 21:15:45 +0900