HOME > Presentation > Detail(The elemental imaging in the advanced materials using fine focused ion beam)坂口 勲, 菱田 俊一, 両見 春樹, 佐藤芳之, 羽田 肇. IISC-15(15th International Workshop on Inelastic Ion Surface Co. October 17, 2004-October 22, 2004.NIMS author(s)SAKAGUCHI, IsaoFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-02-14 10:57:09 +0900 Updated at: 2017-07-10 19:09:02 +0900