HOME > Presentation > DetailSiO2の電子線照射損傷への表面炭素汚染の影響(Surface damage on SiO2/Si specimen caused by electron beam irradiation, about effect of surface pollution)木村 隆, 田沼 繁夫, 福島 整, 荻原 俊弥, 中村拓, 永富隆清, 高井義造. 第54回応用物理学関係連合講演会. March 27, 2007-March 30, 2007.NIMS author(s)OGIWARA, ToshiyaFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-02-14 10:52:27 +0900 Updated at: 2017-07-10 19:52:21 +0900