収束電子回折法を用いたAlNの極性決定評価
(Analysis of Broken Symmetry in Convergent-Beam Electron Diffraction along <1120> and <1100> Zone-Axes of AlN for Polarity Determination)
International Workshop on Nitride Semiconductors 2012. 2012.
NIMS著者
Materials Data Repository (MDR)上の本文・データセット
作成時刻: 2017-02-14 11:45:07 +0900更新時刻: 2017-07-10 21:23:44 +0900