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(EBIC and Cathodoluminescence characterization of artificial grain boundaries formed in direct-bonded Si wafers)
3rd Asian Conference on Crysdtal Growth and Crystal Technology. October 16, 2005-October 19, 2005.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-02-14 10:56:12 +0900 Updated at: 2017-07-10 19:28:07 +0900