(EBIC and Cathodoluminescence characterization of artificial grain boundaries formed in direct-bonded Si wafers)
3rd Asian Conference on Crysdtal Growth and Crystal Technology. 2005.
NIMS著者
Materials Data Repository (MDR)上の本文・データセット
作成時刻: 2017-02-14 10:56:12 +0900更新時刻: 2017-07-10 19:28:07 +0900