(Electrical characterization of Schottky diodes based on boron doped homoepitaxial diamond films by conducting probe atomic force)
2006 EMRS Spring Meeting -Symposium S. 2006.
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Materials Data Repository (MDR)上の本文・データセット
作成時刻: 2017-02-14 10:54:51 +0900更新時刻: 2017-07-10 19:38:32 +0900