HOME > 口頭発表 > 書誌詳細(Characterization of Strain in Multicrystalline Silicon: Correlation between Grain Boundary Character and Strain)陳 君, 福澤理行, 高 鴻, 楊徳仁, 関口 隆史. The 12th BIAMS Conference. 2014.NIMS著者陳 君Materials Data Repository (MDR)上の本文・データセット作成時刻: 2017-02-14 11:08:09 +0900更新時刻: 2017-07-10 21:55:35 +0900